Reconvergent fan-out is a technique to make VLSI logic simulation less pessimistic. Static timing analysis tries to figure out the best and worst case time estimate for each signal as they pass through an electronic device.
Reconvergent fanout is a way to make VLSI static timing analysis less pessimistic. Each time a signal passes thorugh a node, a bit of uncertainty is added to the timing delay. However, if two (ore more) signals pass through the same node, follow separate paths, and then return to the same point, you can remove a fair amount of uncertainty because you know that one point they shared a common path.
When bounded gate delays are used, gate delay fault simulation involves bounded delay simulation of the fault-free circuit and an evaluation of the faulty waveforms. Whenever signals in a combinational circuit diverge from a fanout point and reconverge later, the inputs to the reconvergent gate are correlated.
The detectability of reconvergent fanout stem faults in a combinational logic circuit can be determined by explicitly simulating the faults within limited regions of the circuit. These regions are defined, and an estimate of the fault simulation complexity of the circuit is obtained. Results are presented for ten benchmark circuits.
Reconvergent fan-out is a technique to make VLSI logic simulation less pessimistic. Static timing analysis tries to figure out the best and worst case time estimate for each signal as they pass through an electronic device. Whenever a signal passes through a node, a bit of uncertainty must be added to the time required for the signal to transit that device.
Papers by Author: Xin Liu. Paper Title Page.. This analysis is a heuristic learning method by earlier detecting assignment conflicts. Reconvergent fanout is a fundamental cause of the difficulty in testing generation, because they introduce dependencies in the values that can be assigned to nodes. Paper exploits reconvergent fanout analysis.
This paper provides an overview of some typical methods for reliability analysis with focus on gate-level circuits, large or small, with or without reconvergent fanouts. It is intended to help the readers gain an insight into the reliability issues, and their complexity as well as optional solutions.
Timing Analysis Option SynatiCAD's timing analysis engine uses sophisticated algorithms to detect both timing violations and overly pessimistic assumptions about system performance. The timing analysis engine accounts for timing effects that are difficult to compute manually such as delay correlation, reconvergent fan-out, and jitter and buffering in clock trees.
A reconvergent fanout analysis is presented, the objective of which is twofold. Firstly, to reduce the number of critical paths traced during the path tracing, in order to improve diagnosis accuracy. Next, to obtain a reliable diagnosis by considering all the lines which could be.
This paper describes the theory and implementation of a testability measure program called RFOTM.It is suggested that the real difficulty in test generation should be reflected in testability measure.We analyse the behavior of fanout and reconvergent fanout which cause inconsistency in generating tests.A classification of fanouts is given and a class of fanouts which behaves like fanout-free.
CRITICAL PATH TRACING - AN ALTERNATIVE TO FAULT SIMULATION M. Abramovici P. R. Menon D. T. Miller Bell Laboratories Naperville, Illinois 60566 ABSTRACT We present an alternative to fault simulation, referred to as critical path tracing, that. 2.3 Effects of Reconvergent Fanout.
Regular Papers. Reconvergent-fanout-oriented testability measure. Jianchao Wang, Daozheng Wei Pages 16-28. Regular Papers. Systems programming in the functional language FP. Lingzi Jin, Hong Zhu Pages 40-55. Regular Papers. Hierarchical protocol analysis by temporal logic. Yulin Feng Pages 56-69. Regular Papers. On the condition for FSM being a.
Min-max timing analysis and an application to asynchronous circuits.. We also describe an efficient reconvergent fanout analysis technique that helps in increasing the accuracy of simulation.
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As well as identifying all the gates at which reconvergence occurs, the reconvergent sites, the algorithm lists all the fanout nodes that reconverge at each of these sites. The automatic detection of reconvergence can be used for improving the testability analysis of circuits containing such fanouts.
Journal of Biomimetics, Biomaterials and Biomedical Engineering Materials Science. Defect and Diffusion Forum.
VLSI systems are becoming very complex and difficult to test. Traditional stuck-at fault problems may be inadequate to model possible manufacturing defects in the integrated ciruit. Hierarchial models are needed that are easy to use at the transistor and functional levels. Stuck-open faults present severe testing problems in CMOS circuits, to overcome testing problems testable designs are.
The performance of a fast fault simulation algorithm for combinational circuits, such as the critical-path-tracing method, is determined primarily by the efficiency with which it can deduce the.